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Functionalized TEM Grids

Functionalized TEM Grids
By matching the surface functionalization to your sample, you can dramatically improve sample uniformity and coverage while eliminating sample preparation artifacts such as aggregation and drying effects, yielding more accurate data and better images.

Products for Focused Ion Beam (FIB)

Products for Focused Ion Beam
Dune’s Silicon FIB Grids offer ultra-clean, metal-free substrate resulting in dramatic improvement in the preparation of in-situ FIB specimens for TEM. more>>