Dune Sciences Announces Smart Grids^TM Platform for Electron Microscopy. New SiO2 Membrane Windows Improve Imaging Quality, Speed Sample Preparation, Enhance Analytical Capability, and Expand the Range of Useful Information That Can Be Obtained Through Transmission Electron Microscopy (TEM).

Eugene, OR- Dune Sciences, LLC has developed an innovative technology for producing TEM Grids that enable the most comprehensive understanding of structural, chemical and functional characteristics at the nanoscale for applications including metrology, nanomaterials, pharmaceuticals, life sciences, semiconductor processing, QC and failure analysis. Smart Grids are a cross-disciplinary tool that integrates the combined capabilities of electron microscopy, surface science, and electronic and optical interrogation in a single sample.

Smart Grids are produced from thin silicon wafers with thermally-grown SiO2 membrane windows. Their surface chemistry and functionalization are tailored to accommodate a wide range of material samples. These patent pending grids are available in several standard configurations. Customized geometries and surface chemistries are also available. Using appropriately configured Smart Grids, sample quality is enhanced and time and effort needed for preparation is dramatically reduced.

"While the remarkable developments in instrumentation for electron microscopyhave opened a wide range of opportunities for structural characterization of materials, existing sample preparation methods and TEM grids have become the limiting factor" said John Miller, Ph.D, Dune's CEO. "Our testing of Smart Grids has demonstrated their ability to produce an ultra-low background for superlative image resolution. They enable researchers to integrate multiple analytical techniques and allow for multiple processing steps with sequential imaging. Basically speaking, Smart Grids offer a new window of opportunity for nanostructure visualization and characterization in the form of advanced TEM grids that accommodate a wide range of characterization methods on the same sample".